DocumentCode :
1382176
Title :
Nonuniform temperature and strain fields in a powered package
Author :
Wakil, Jamil ; Ho, Paul S.
Author_Institution :
Mech./Thermal Anal. & Test Group, IBM Corp., Endicott, NY, USA
Volume :
23
Issue :
3
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
521
Lastpage :
527
Abstract :
This paper analyzes the nonuniform temperature and strain fields resulting from power dissipation in an electronic package. A 208 lead plastic quad flat pack (PQFP) manufactured by Texas Instruments is used to show the temperature distribution and mechanical deformation resulting from power dissipation in the package. The package is tested experimentally and thermally modeled using finite element analysis to obtain the temperature distribution in the active package. The moire interferometry technique is used to acquire displacement contours of an active PQFP and the results are compared to a uniformly heated sample. The results revealed that the thermal loading due to internal power dissipation produces significantly different strains than a uniformly heated sample
Keywords :
deformation; finite element analysis; integrated circuit packaging; plastic packaging; temperature distribution; thermal analysis; FEM; displacement contours; electronic package; finite element analysis; internal power dissipation; mechanical deformation; moire interferometry technique; nonuniform strain field; nonuniform temperature field; plastic QFP; plastic quad flat pack; powered package; temperature distribution; thermal loading; thermal modelling; Capacitive sensors; Electronic packaging thermal management; Electronics packaging; Finite element methods; Instruments; Manufacturing; Plastic packaging; Power dissipation; Temperature distribution; Testing;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.868852
Filename :
868852
Link To Document :
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