DocumentCode
1382264
Title
Ray representation of longitudinal lateral waves in acoustic microscopy
Author
Chan, Kai Hong ; Bertoni, Henry L.
Author_Institution
Polytech. Univ., New York, NY, USA
Volume
38
Issue
1
fYear
1991
Firstpage
27
Lastpage
34
Abstract
For object materials having a large enough Rayleigh velocity, the V(z) (where V is the output voltage and z is the defocus distance) variation is mainly due to interference between the fields of the geometrically reflected wave and the leaky Rayleigh wave. However, for materials, such as organic compounds, having a low Rayleigh velocity, the leaky Rayleigh wave is not excited. For this case, the lateral wave resulting from propagation along the surface of the longitudinal wave plays a significant role in determining the V(z) dependence. The effect of the lateral wave contribution on V(z) is studied. Ray optics is to derive an expression giving the influence of the longitudinal lateral wave. Good agreement is found between the theory and measurements for z not near zero. Because of the ease with which the longitudinal wave velocity can be obtained from V(z), one can conveniently determine the elastic constant c/sub 11/ of isotropic materials using the acoustic microscope.<>
Keywords
acoustic microscopy; organic compounds; ultrasonic propagation; Rayleigh velocity; Rayleigh wave velocity; V(z) dependence; acoustic material signature; acoustic microscopy; defocus distance; elastic constant determination; geometrically reflected wave; isotropic materials; lateral wave contribution; leaky Rayleigh wave; longitudinal lateral waves; measurements; organic compounds; output voltage; ray optics; ray representation; theory; Acoustic materials; Acoustic measurements; Acoustic reflection; Acoustic waves; Interference; Microscopy; Organic compounds; Organic materials; Surface waves; Voltage;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.67831
Filename
67831
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