• DocumentCode
    1382264
  • Title

    Ray representation of longitudinal lateral waves in acoustic microscopy

  • Author

    Chan, Kai Hong ; Bertoni, Henry L.

  • Author_Institution
    Polytech. Univ., New York, NY, USA
  • Volume
    38
  • Issue
    1
  • fYear
    1991
  • Firstpage
    27
  • Lastpage
    34
  • Abstract
    For object materials having a large enough Rayleigh velocity, the V(z) (where V is the output voltage and z is the defocus distance) variation is mainly due to interference between the fields of the geometrically reflected wave and the leaky Rayleigh wave. However, for materials, such as organic compounds, having a low Rayleigh velocity, the leaky Rayleigh wave is not excited. For this case, the lateral wave resulting from propagation along the surface of the longitudinal wave plays a significant role in determining the V(z) dependence. The effect of the lateral wave contribution on V(z) is studied. Ray optics is to derive an expression giving the influence of the longitudinal lateral wave. Good agreement is found between the theory and measurements for z not near zero. Because of the ease with which the longitudinal wave velocity can be obtained from V(z), one can conveniently determine the elastic constant c/sub 11/ of isotropic materials using the acoustic microscope.<>
  • Keywords
    acoustic microscopy; organic compounds; ultrasonic propagation; Rayleigh velocity; Rayleigh wave velocity; V(z) dependence; acoustic material signature; acoustic microscopy; defocus distance; elastic constant determination; geometrically reflected wave; isotropic materials; lateral wave contribution; leaky Rayleigh wave; longitudinal lateral waves; measurements; organic compounds; output voltage; ray optics; ray representation; theory; Acoustic materials; Acoustic measurements; Acoustic reflection; Acoustic waves; Interference; Microscopy; Organic compounds; Organic materials; Surface waves; Voltage;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.67831
  • Filename
    67831