Title :
Hidden Head-In-Pillow soldering failures
Author :
Vandevelde, B. ; Willems, Geert ; Allaert, Bart
Author_Institution :
imec, Leuven, Belgium
Abstract :
One of the upcoming reliability issues which is related to the lead-free solder introduction, are the head-in-pillow solderability problems, mainly for BGA packages. These problems are due to excessive package warpage at reflow temperature. Both convex and concave warpage at reflow temperature can lead to the head-in-pillow problem where the solder paste and solder ball are in mechanical contact but not forming one uniform joint. With the thermo-Moiré profile measurements, this paper explains for two flex BGA packages the head-in-pillow. Both local and global height differences higher than 100 μm have been measured at solder reflow temperature. This can be sufficient to have no contact between the molten solder ball and solder paste. Finally, the impact of package drying is measured.
Keywords :
ball grid arrays; failure analysis; integrated circuit packaging; reflow soldering; BGA packages; concave warpage; convex warpage; global height differences; head-in-pillow solderability problems; lead-free solder introduction; local height differences; mechanical contact; molten solder ball; package drying; package warpage; reliability issues; solder paste; solder reflow temperature; thermo-Moiré profile measurements; Abstracts; Lead;
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
DOI :
10.1109/EuroSimE.2014.6813875