DocumentCode
1382588
Title
Quality Factor Analysis for Cross-Coupled
Oscillators Using a Time-Varying Root Locus
Author
Broussev, Svetozar S. ; Tchamov, Nikolay T.
Author_Institution
Dept. of Commun. Eng., Tampere Univ. of Technol., Tampere, Finland
Volume
59
Issue
1
fYear
2012
Firstpage
25
Lastpage
29
Abstract
An extraction of an effective oscillator Q factor in cross-coupled LC oscillators using time-varying root locus is proposed. The extraction utilizes root computations and analytical expression of the cross-coupled-pair admittance. The methodology permits to investigate the Q-factor degradation mechanisms in large-signal LC oscillators and to compare different oscillator topologies. The obtained effective Q factor is validated through SpectreRF simulations and phase noise measurements of a voltage-controlled oscillator fabricated on a 130-nm process.
Keywords
Q-factor; voltage-controlled oscillators; Q-factor degradation; cross-coupled LC oscillators; cross-coupled-pair admittance; oscillator Q factor; quality factor analysis; time-varying root locus; voltage-controlled oscillator; Admittance; Phase measurement; Phase noise; Q factor; Voltage-controlled oscillators; Oscillator; Q factor; time-varying root locus (TVRL);
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2011.2174673
Filename
6086754
Link To Document