• DocumentCode
    1382609
  • Title

    Stability of characteristic curves of nonlinear resistive circuits

  • Author

    Jiang, Lingge ; Nishio, Yoshifumi ; Ushida, Akio

  • Author_Institution
    Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
  • Volume
    45
  • Issue
    6
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    634
  • Lastpage
    643
  • Abstract
    In this paper, we discuss the stability of the characteristic curves for nonlinear resistive circuits including parasitic elements. Although the dc solution is determined by analyzing the nonlinear resistive circuit, its equilibrium point will be stable or unstable because every resistive element has a small parasitic component in practice. We consider here two parasitic elements: a capacitor between every resistor node and ground and an inductor in series with each resistor. Of course, the stability can be decided by solving the variational equation at each equilibrium point obtained by the dc analysis; however, this is very time consuming. We show here that the stability is mainly changed at the boundary of the presence of negative differential resistance (NDR) and the bifurcation points, such as turning and pitchfork points on the dc characteristic curves. The instability regions of the solution curve are easily found by both the locations of bifurcation points and NDR regions of the nonlinear resistors
  • Keywords
    bifurcation; circuit stability; negative resistance devices; nonlinear network analysis; variational techniques; NDR regions; bifurcation points; characteristic curves; equilibrium point; instability regions; negative differential resistance; nonlinear resistive circuits; parasitic component; parasitic elements; pitchfork points; stability; turning points; variational equation; Bifurcation; Capacitors; Circuit stability; Electronic circuits; Equations; Helium; Inductors; Resistors; Stability analysis; Turning;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.678477
  • Filename
    678477