Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications

This work presents an in-depth wide-frequency band assessment of 28 nm FDSOI MOSFETs for analogue and RF applications. The focus is mainly on such figures of merit (FoM) as the transconductance g_m, the output conductance g_d, the intrinsic gain A_v and the cut-off frequencies f_t and f_max. Firstly, 28 nm FDSOI MOSFETs are compared with other advanced devices and are shown to outperform them. Secondly, g_m-A_v analogue metrics is demonstrated to be affected by operation frequency. Small-signal parameters variation is limited and dominated by self-heating effect. This is in contrast to the first generation of ultra-thin body and BOX devices without a ground plane where coupling through the substrate has a considerable effect. Thirdly, the self-heating effect is analysed and shown to be smaller than previously predicted by simulations for such devices. Fourthly, it is shown that f_t reaches ~270 GHz in the shortest devices.