• DocumentCode
    1382786
  • Title

    Near-field to far-field transformation utilising multilevel plane wave representation for planar and quasi-planar measurement contours

  • Author

    Schmidt, C.H. ; Eibert, Thomas F.

  • Author_Institution
    Lehrstuhl fur Hochfrequenztech., Tech. Univ. Munchen, Munich, Germany
  • Volume
    4
  • Issue
    11
  • fYear
    2010
  • fDate
    11/1/2010 12:00:00 AM
  • Firstpage
    1829
  • Lastpage
    1837
  • Abstract
    A fully probe-corrected near-field far-field transformation employing plane wave expansion and diagonal translation operators has recently been presented, which is able to efficiently carry out transformations for arbitrary measurement point locations. Here, the algorithm is discussed in its multilevel version for the application to planar and quasi-planar measurement contours. The measurement points are grouped in a multilevel box structure and translations of the plane waves, representing the antenna under test, are only carried out to the box centres on the highest level. The plane waves are further processed through the different levels towards the measurement points with a decreasing sampling rate using a disaggregation and anterpolation procedure. This reduces the overall complexity to O(N q log N), N being the total number of measurement points, which is comparable to the classical fast Fourier transform-based algorithms for planar measurements. The proposed algorithm includes a full correction of arbitrary near-field probes and is able to cope with irregular measurement grids and is further optimised for highly directive antennas within this contribution.
  • Keywords
    antenna radiation patterns; antenna testing; antenna under test; diagonal translation operators; multilevel plane wave representation; near-field to far-field transformation; planar measurements; plane wave expansion; quasi-planar measurement contours;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas & Propagation, IET
  • Publisher
    iet
  • ISSN
    1751-8725
  • Type

    jour

  • DOI
    10.1049/iet-map.2009.0076
  • Filename
    5639181