DocumentCode :
1382823
Title :
Thermal behavior depending on emitter finger and substrate configurations in power heterojunction bipolar transistors
Author :
Kim, Chang-Woo ; Goto, Norio ; Honjo, Kazuhiko
Author_Institution :
Microelectron. Res. Labs., NEC Corp., Tsukuba, Japan
Volume :
45
Issue :
6
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
1190
Lastpage :
1195
Abstract :
Analytical and experimental results are used to investigate thermal behavior depending on the emitter-finger area and substrate thickness in multifinger heterojunction bipolar transistors (HBT´s). The temperature distributions along the depth direction of the substrate are obtained from a three-dimensional (3-D) analysis. The calculated results show a 3-D effect which depends upon the emitter finger area. This effect weakens with increasing the emitter-finger area. As the effect weakens, thinning the substrate effectively reduces the junction temperature (thermal resistance). This is verified by the measured results obtained from a simple thermal-resistance measurement
Keywords :
heterojunction bipolar transistors; power bipolar transistors; temperature distribution; thermal analysis; thermal resistance; depth direction; emitter finger; junction temperature; power heterojunction bipolar transistors; substrate configurations; temperature distributions; thermal behavior; Bismuth; Fingers; Gallium arsenide; Heterojunction bipolar transistors; Laboratories; National electric code; Steady-state; Systems engineering and theory; Temperature distribution; Thermal conductivity;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.678507
Filename :
678507
Link To Document :
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