• DocumentCode
    1382844
  • Title

    High efficiency and high linearity InGaP/GaAs HBT power amplifiers: matching techniques of source and load impedance to improve phase distortion and linearity

  • Author

    Iwai, Taisuke ; Ohara, Shiro ; Yamada, Hiroshi ; Yamaguchi, Yasuhiro ; Imanishi, Kenji ; Jeshin, K.

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • Volume
    45
  • Issue
    6
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    1196
  • Lastpage
    1200
  • Abstract
    This paper reports on a matching technique of the source and load impedance focused on a phase distortion of InGaP/GaAs HBT power amplifiers to simultaneously achieve a high efficiency and a high linearity performance. Load-pull measurements were done to maximize power added efficiency (PAE) and source pull measurements to minimize the phase distortion and adjacent channel leakage power (ACP). Our HBT exhibited a high PAE of 60.7% and an ACP at a 50 kHz offset frequency of -51 dBc for 1.5 GHz π/4-shift QPSK modulated signal with an output power (Pcut) of 31 dBm under a supply voltage of 3.5 V
  • Keywords
    III-V semiconductors; UHF bipolar transistors; UHF power amplifiers; electric distortion; equivalent circuits; gallium arsenide; gallium compounds; heterojunction bipolar transistors; impedance matching; indium compounds; power bipolar transistors; 1.5 GHz; 3.5 V; 60.7 percent; HBT power amplifiers; InGaP-GaAs; adjacent channel leakage power; high efficiency; high linearity; linearity improvement; load impedance; load-pull measurements; matching techniques; phase distortion improvement; power added efficiency; source impedance; source pull measurements; Distortion measurement; Frequency; Gallium arsenide; Heterojunction bipolar transistors; High power amplifiers; Impedance; Linearity; Phase distortion; Phase measurement; Power measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.678510
  • Filename
    678510