Title :
High-frequency periodic time-domain waveform measurement system
Author :
Sipilä, Markku ; Lehtinen, Kari ; Porra, Veikko
Author_Institution :
Fac. of Electr. Eng., Helsinki Univ., of Technol., Espoo, Finland
fDate :
10/1/1988 12:00:00 AM
Abstract :
A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed
Keywords :
electric current measurement; error correction; measurement errors; microwave measurement; semiconductor device testing; solid-state microwave devices; voltage measurement; wave analysers; HF type; circuit model; current waveforms; error correction; high-speed sampling oscilloscope; measurement fixture; measurement-system characterization; nonlinear microwave device; periodic time-domain waveform measurement system; semiconductor devices; signal processing errors; Current measurement; Frequency domain analysis; Microwave devices; Microwave measurements; Oscilloscopes; Performance evaluation; Sampling methods; Time domain analysis; Time measurement; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
