DocumentCode :
138306
Title :
Materials and integration schemes for above-IC integrated optics
Author :
Schmitz, Jurriaan ; Rangarajan, Badrinarayanan ; Kovalgin, Alexey Yu
Author_Institution :
MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
153
Lastpage :
156
Abstract :
A study is presented on silicon oxynitride material for waveguides and germanium-silicon alloys for p-i-n diodes. The materials are manufactured at low, CMOS-backend compatible temperatures, targeting the integration of optical functions on top of CMOS chips. Low-temperature germanium-silicon deposition, crystallization and doping are studied for integrated photo-detection up to ~1500 nm wavelength. An inductively-coupled-plasma chemical vapor deposition process is presented for silicon oxynitride manufacturing at 150 °C wafer temperature, yielding low-loss material in a wide optical spectral range. Integration schemes for an optical plane on top of CMOS are discussed.
Keywords :
CMOS integrated circuits; Ge-Si alloys; crystallisation; integrated optoelectronics; optical waveguides; p-i-n diodes; plasma CVD; semiconductor doping; semiconductor materials; CMOS chips; CMOS-backend compatible temperatures; GeSi; SiON; above-IC integrated optics; crystallization; germanium-silicon alloys; inductively-coupled-plasma chemical vapor deposition process; integrated photo-detection; low-loss material; low-temperature germanium-silicon deposition; optical functions; optical plane; p-i-n diodes; silicon oxynitride material; temperature 150 degC; waveguides; CMOS integrated circuits; Films; Optical device fabrication; Optical waveguides; Silicon; CMOS; MEMS; PECVD; SiON; WDMA; above-IC; germanium-silicon; integrated circuit fabrication; integrated optics; microfabrication; photodetectors; post-processing; process integration; silicon-germanium; temperature budget; thermal budget; waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2014 15th International Conference on
Conference_Location :
Stockholm
Type :
conf
DOI :
10.1109/ULIS.2014.6813921
Filename :
6813921
Link To Document :
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