• DocumentCode
    138306
  • Title

    Materials and integration schemes for above-IC integrated optics

  • Author

    Schmitz, Jurriaan ; Rangarajan, Badrinarayanan ; Kovalgin, Alexey Yu

  • Author_Institution
    MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
  • fYear
    2014
  • fDate
    7-9 April 2014
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    A study is presented on silicon oxynitride material for waveguides and germanium-silicon alloys for p-i-n diodes. The materials are manufactured at low, CMOS-backend compatible temperatures, targeting the integration of optical functions on top of CMOS chips. Low-temperature germanium-silicon deposition, crystallization and doping are studied for integrated photo-detection up to ~1500 nm wavelength. An inductively-coupled-plasma chemical vapor deposition process is presented for silicon oxynitride manufacturing at 150 °C wafer temperature, yielding low-loss material in a wide optical spectral range. Integration schemes for an optical plane on top of CMOS are discussed.
  • Keywords
    CMOS integrated circuits; Ge-Si alloys; crystallisation; integrated optoelectronics; optical waveguides; p-i-n diodes; plasma CVD; semiconductor doping; semiconductor materials; CMOS chips; CMOS-backend compatible temperatures; GeSi; SiON; above-IC integrated optics; crystallization; germanium-silicon alloys; inductively-coupled-plasma chemical vapor deposition process; integrated photo-detection; low-loss material; low-temperature germanium-silicon deposition; optical functions; optical plane; p-i-n diodes; silicon oxynitride material; temperature 150 degC; waveguides; CMOS integrated circuits; Films; Optical device fabrication; Optical waveguides; Silicon; CMOS; MEMS; PECVD; SiON; WDMA; above-IC; germanium-silicon; integrated circuit fabrication; integrated optics; microfabrication; photodetectors; post-processing; process integration; silicon-germanium; temperature budget; thermal budget; waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2014 15th International Conference on
  • Conference_Location
    Stockholm
  • Type

    conf

  • DOI
    10.1109/ULIS.2014.6813921
  • Filename
    6813921