DocumentCode
1383469
Title
Effect of crystal orientation on lapping and polishing processes of natural quartz
Author
Guzzo, Pedro L. ; De Mello, José Daniel B
Author_Institution
Dept. de Ciencias Fisicas, Univ. Fed. de Uberlandia, Brazil
Volume
47
Issue
5
fYear
2000
Firstpage
1217
Lastpage
1227
Abstract
Lapping and polishing processes of natural quartz are investigated in relation to crystallographic orientation and applied normal stress. Weight loss measurements and surface profilometry were carried out in X-, Y-, Z-, and AT-cut samples. The relationship found between material removal rate and stress depends on specimen orientation. Based on indentation fracture mechanics, this behavior is discussed in relation to fracture toughness and scratch hardness anisotropy of quartz crystals. Scanning electron microscopy (SEM) shows that brittle microcracking is the primary mechanism involved with material removal in the lapping process. Plastic deformation mechanisms begin to operate on lapped and polished surfaces above a certain value of stress. Surface profiles and SEM micrographs show that the roughness of lapped surfaces decreases with increasing normal stress, but an opposite behavior is observed in polished surfaces.
Keywords
abrasion; crystal orientation; polishing; quartz; SiO/sub 2/; abrasive wear; brittle microcracking; crystallographic orientation; fracture toughness; indentation fracture mechanics; lapping; material removal rate; natural quartz crystal; normal stress; plastic deformation; polishing; scanning electron microscopy; scratch hardness anisotropy; surface profilometry; surface roughness; weight loss; Crystalline materials; Crystallography; Lapping; Loss measurement; Rough surfaces; Scanning electron microscopy; Stress; Surface cracks; Surface roughness; Weight measurement;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.869068
Filename
869068
Link To Document