DocumentCode
1383972
Title
Robust Session Variability Compensation for SVM Speaker Verification
Author
Seo, Hyunson ; Jung, Chi-Sang ; Kang, Hong-Goo
Author_Institution
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Volume
19
Issue
6
fYear
2011
Firstpage
1631
Lastpage
1641
Abstract
This paper presents an enhanced nuisance attribute projection (NAP) method to improve the performance of speaker verification systems in mismatched train and test conditions. Unlike the conventional NAP training method that does not take any scheme to discriminate the source of nuisance, the proposed method quantitatively estimates the source of nuisance based on the statistics of given background speakers´ eigenvalues. The estimated values are used for defining a discriminative weight for each of background speakers and selectively including the statistics of between-class scatter or of within-class scatter from them. Through the scheme, we intend to design a more robust projection matrix which involves less speaker-dependent or speaker-intrinsic variability while including more latent nuisance factors beyond the common within-class scatter of backgrounds. Experimental results on the recent NIST SRE evaluations demonstrate that the proposed algorithms produce consistent improvement over the previous NAP approaches.
Keywords
eigenvalues and eigenfunctions; matrix algebra; speaker recognition; statistical analysis; support vector machines; SVM speaker verification; background speaker; discriminative weight; nuisance attribute projection training method; projection matrix; session variability compensation; source estimation; speaker eigenvalue; speaker-dependent variability; speaker-intrinsic variability; statistics; Covariance matrix; Eigenvalues and eigenfunctions; NIST; Optimization; Support vector machines; Telephone sets; Training; Intersession variability (ISV) compensation; NIST SRE; nuisance attributes projection (NAP); speaker verification;
fLanguage
English
Journal_Title
Audio, Speech, and Language Processing, IEEE Transactions on
Publisher
ieee
ISSN
1558-7916
Type
jour
DOI
10.1109/TASL.2010.2093895
Filename
5640656
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