Title :
Improving functional density using run-time circuit reconfiguration [FPGAs]
Author :
Wirthlin, Michael J. ; Hutchings, Brad L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
The ability to provide flexibility and allow fine-grain circuit specialization make field programmable gate arrays (FPGA´s) ideal candidates for computing elements within application-specific architectures. The benefits of gate-level specialization and reconfigurability can be extended by reconfiguring circuit resources at run-time. This technique, termed run-time reconfiguration (RTR), allows the exploitation of dynamic conditions or temporal locality within application-specific problems. For several applications, this technique has been shown to reduce the hardware resources required for computation. The use of this technique on conventional FPGA´s, however, requires additional time for circuit reconfiguration. A functional density metric is introduced that balances the advantages of RTR against its associated reconfiguration costs. This metric is used to justify run-time reconfiguration against other more conventional approaches. Several run-time reconfigured applications are presented and analyzed using this approach.
Keywords :
field programmable gate arrays; logic design; reconfigurable architectures; FPGA design; application-specific architectures; dynamic conditions; field programmable gate arrays; fine-grain circuit specialization; functional density improvement; functional density metric; gate-level reconfigurability; gate-level specialization; reconfiguration costs; run-time circuit reconfiguration; temporal locality; Application software; Computer applications; Computer architecture; Cryptography; Decoding; Field programmable gate arrays; Flexible printed circuits; Hardware; High performance computing; Runtime;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on