Title :
Spin-valve read heads with NiFe/Co90Fe10 layers for 5 Gbit/in2 density recording
Author :
Kanai, H. ; Yamada, K. ; Aoshima, K. ; Ohtsuka, Y. ; Kane, J. ; Kanamine, M. ; Toda, J. ; Mizoshita, Y.
Author_Institution :
File Memory Lab., Fujitsu Labs. Ltd., Atsugi, Japan
fDate :
9/1/1996 12:00:00 AM
Abstract :
Successful use of a NiFe/Co90Fe10 bilayer as a soft magnetic free layer in spin-valve films with a GMR enhanced structure comprised of NiFe/Co90Fe10/Cu/Co90 Fe10/FeMn is outlined. The GMR ratio of the spin-valve film with Co90Fe10 is over 7% and the coercivity of the free NiFe/Co90Fe10 bilayers is less than 5 Oe. A merged inductive/spin-valve head was fabricated with a read track-width of 1.3 μm and a read gap-length of 0.26 μm using spin-valve film with a Ta(50 Å)/NiFe(45 Å)/Co90Fe 10(30 Å)/Cu(32 Å)/Fe10(22 Å)/FeMn(100 Å)/Ta(100 Å) structure and 260 Å thick domain control Co78Cr10Pt12 magnet layers. Its read/write performance was tested on a low noise CoCr 17Pt5Ta4 thin film disk with an Mr·t of 0.41 memu/cm2 and a coercivity of 2500 Oe. There is no Barkhausen noise in the readback waveform. The result of the microtrack sensitivity profiles reveals an effective read track-width of 0.8 μm. A normalized output for a track-width of 880 μVpp/μm and D50 of 166 kFCI was obtained. Using a PRML channel, a bit error rate of less than 10-8 was obtained without error correction at a data rate of 3.3 MB/s and at a linear density of 217 kBPI on a thin film disk with an Mr·t of 0.72 memu/cm2. Thus, 5 Gbit/in2 density recording with a linear density of 217 kBPI and a track density of 23 kTPI is possible
Keywords :
cobalt alloys; coercive force; giant magnetoresistance; iron alloys; magnetic heads; magnetic multilayers; magnetoresistive devices; nickel alloys; soft magnetic materials; Barkhausen noise; GMR ratio; NiFe-Co90Fe10; NiFe/Co90Fe10 bilayer; PRML channel; bit error rate; coercivity; data rate; domain control Co78Cr10Pt12 magnet layer; gap length; high density recording; inductive/spin-valve read head; linear density; low noise CoCr17Pt5Ta4 thin film disk; microtrack sensitivity; soft magnetic free layer; track width; Chromium; Coercive force; Iron; Magnetic domains; Magnetic films; Magnetic heads; Soft magnetic materials; Testing; Thickness control; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on