DocumentCode :
1384144
Title :
Instability evaluation for permanent magnet biased magnetoresistive heads
Author :
Suzuki, Tetsuhiro ; Ishihara, Kunihiko ; Matsutera, Hisao
Author_Institution :
Functional Devices Res. Labs., NEC Corp., Tokyo, Japan
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3383
Lastpage :
3385
Abstract :
We have used micromagnetic modeling to study instability of permanent magnet biased magnetoresistive heads. A new approach based on the dependence of reproducing characteristics on initial magnetization is proposed to examine the instability of both AMR and spin-valve heads. When the permanent magnet strength is smaller than a critical value, the output voltage of an AMR head depends on the initial magnetization, which results in instability. The critical permanent magnet strength gradually increases as shield-to-shield separation decreases. The critical value for spin-valve heads is smaller than that for AMR heads, because the pinned layer under a large exchange field does not change its magnetization at all
Keywords :
magnetic heads; magnetoresistive devices; permanent magnets; AMR head; exchange field; initial magnetization; instability; micromagnetic model; output voltage; permanent magnet biased magnetoresistive head; pinned layer; shield-to-shield separation; spin-valve head; Anisotropic magnetoresistance; Magnetic heads; Magnetic separation; Magnetic shielding; Magnetostatics; Micromagnetics; Permanent magnets; Saturation magnetization; Soft magnetic materials; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538631
Filename :
538631
Link To Document :
بازگشت