• DocumentCode
    1384144
  • Title

    Instability evaluation for permanent magnet biased magnetoresistive heads

  • Author

    Suzuki, Tetsuhiro ; Ishihara, Kunihiko ; Matsutera, Hisao

  • Author_Institution
    Functional Devices Res. Labs., NEC Corp., Tokyo, Japan
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3383
  • Lastpage
    3385
  • Abstract
    We have used micromagnetic modeling to study instability of permanent magnet biased magnetoresistive heads. A new approach based on the dependence of reproducing characteristics on initial magnetization is proposed to examine the instability of both AMR and spin-valve heads. When the permanent magnet strength is smaller than a critical value, the output voltage of an AMR head depends on the initial magnetization, which results in instability. The critical permanent magnet strength gradually increases as shield-to-shield separation decreases. The critical value for spin-valve heads is smaller than that for AMR heads, because the pinned layer under a large exchange field does not change its magnetization at all
  • Keywords
    magnetic heads; magnetoresistive devices; permanent magnets; AMR head; exchange field; initial magnetization; instability; micromagnetic model; output voltage; permanent magnet biased magnetoresistive head; pinned layer; shield-to-shield separation; spin-valve head; Anisotropic magnetoresistance; Magnetic heads; Magnetic separation; Magnetic shielding; Magnetostatics; Micromagnetics; Permanent magnets; Saturation magnetization; Soft magnetic materials; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538631
  • Filename
    538631