• DocumentCode
    1384191
  • Title

    Recording limitations for SAL/MR and dual-stripe heads

  • Author

    Zhu, Jian-Gang ; O´Connor, D.J.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3401
  • Lastpage
    3403
  • Abstract
    A micromagnetic modeling analysis is performed to investigate the areal recording density limitations of the soft adjacent layer (SAL) biased and dual-stripe (DS) magnetoresistive recording head structures. The simulation analysis yielded four principle results: First, the higher output advantage of the DSMR head structure over the SAL head structure is largely due to the ohmic shunting loss of the SAL layer in the present SAL heads. Second, both the SAL and DSMR head structures are capable of supporting read track width as narrow as W=0.5 μm. Third, in order to support high linear densities, the spacing between the two MR stripes in the DSMR structure must be narrowed to obtain the adequate spectral response. There is, however, a corresponding amplitude reduction that is due to the magnetostatic interaction between the two stripes. Fourth, the track width broadening inherent in the DSMR structure when the two MR films are misaligned can be eliminated with a sense current inversion
  • Keywords
    magnetic heads; magnetic multilayers; magnetoresistive devices; soft magnetic materials; DSMR head; SAL/MR head; areal recording density; dual-stripe head; magnetoresistive head; magnetostatic interaction; micromagnetic model; ohmic shunting loss; sense current inversion; simulation; soft adjacent layer biased head; spectral response; track width; Anisotropic magnetoresistance; Disk drives; Giant magnetoresistance; Magnetic analysis; Magnetic heads; Magnetic separation; Magnetostatics; Micromagnetics; Performance analysis; Soft magnetic materials;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538637
  • Filename
    538637