Title :
Track-edge read-write effect of inductive/MR dual element heads
Author :
Yuan, Samuel W. ; Thayamballi, Pradeep ; Tong, Hua-Ching
Author_Institution :
Read-Rite Corp., Fremont, CA, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
The effect of side-writing from the inductive writer on the read-back properties of MR heads is studied by recording physics analysis and micromagnetic simulation. Inductive write heads with and without pole trimming, and MR read heads with overlay and contiguous-junction designs are investigated. It is found that the contiguous-junction MR reader is robust against written track-edge perturbations, and in general, track-trimming for both the write head and the read sensor is beneficial for optimum performance
Keywords :
magnetic heads; magnetoresistive devices; MR read head; contiguous-junction design; inductive write head; inductive/MR dual element head; micromagnetic simulation; overlay design; pole trimming; recording physics analysis; side-writing; track trimming; track-edge read-write effect; Analytical models; Magnetic heads; Magnetic sensors; Magnets; Micromagnetics; Physics; Robustness; Sensor phenomena and characterization; Transistors; Writing;
Journal_Title :
Magnetics, IEEE Transactions on