DocumentCode :
1384336
Title :
Crosstrack profiles of thin film MR tape heads using the azimuth displacement method
Author :
Dee, Richard H. ; Cates, James C.
Author_Institution :
Storage Technol. Corp., Louisville, CO, USA
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3464
Lastpage :
3466
Abstract :
We report a new technique for measurement of crosstrack profiles of magnetoresistive (MR) read elements in tape heads. This method minimizes errors due to tape tracking and quickly delivers crosstrack profiles with good signal-to-noise ratios. In this technique the read element is located downstream from the write head in a typical tape head configuration. AC erased tape is passed over the head and the write head is turned on. The profile of the read element is scanned by changing the lateral position of the read element relative to the write head by varying the azimuth angle between the head and tape with a positioner. Offtrack position is calculated from the linear displacement of the positioner used to generate the azimuth angle. The measurement technique is well suited for characterizing MR read heads for tape servo applications and for examining performance reliability and repeatability
Keywords :
magnetic heads; magnetic thin film devices; magnetoresistive devices; azimuth displacement; crosstrack profile; magnetoresistive read element; measurement technique; signal-to-noise ratio; thin film MR tape head; Azimuth; Data mining; Displacement measurement; Frequency; Magnetic heads; Magnetoresistance; Measurement techniques; Servomechanisms; Signal to noise ratio; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538658
Filename :
538658
Link To Document :
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