• DocumentCode
    1384337
  • Title

    Application of continuous wavelet transform for study of voltage flicker-generated signals

  • Author

    Huang, Shyh-Jier ; Hsieh, Cheng-Tao

  • Author_Institution
    Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    36
  • Issue
    3
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    925
  • Lastpage
    932
  • Abstract
    An application of continuous wavelet transform (CWT) for the analysis of voltage flicker-generated signals is proposed. With the time-frequency localization characteristics embedded in wavelets, the time and frequency information of a waveform can be integrally presented, thereby enhancing the monitoring of voltage flicker-generated signals at different time intervals. The Morlet wavelet has been selected as the basis function for the CWT in the proposed method. The merit of the method lies in that the signal component at any frequency of interest can be more easily monitored than by discrete wavelet transform (DWT). The high frequency required in the voltage flicker study can be also comfortably accomplished. This approach has been applied to investigate various simulated voltage flicker-generated signals, and inspect the data recorded from the actual are furnace operation. Test results help solidify the practicality and advantages of the proposed method for the applications
  • Keywords
    digital simulation; flicker noise; signal processing; voltage measurement; wavelet transforms; Morlet wavelet; continuous wavelet transform; discrete wavelet transform; simulated voltage flicker-generated signals; time-frequency localization characteristics; voltage flicker modelling; voltage flicker-generated signals; Continuous wavelet transforms; Discrete wavelet transforms; Furnaces; Monitoring; Signal analysis; Testing; Time frequency analysis; Voltage fluctuations; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.869511
  • Filename
    869511