Title :
The performance of dual-stripe magnetoresistive heads in near contact
Author :
Fu, Yen ; Hsu, Yimin ; Chhabra, Devendra ; Zhu, Li-Yan ; Wachenschwanz, David
Author_Institution :
Headway Technol. Inc., Milpitas, CA, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
The suitability of a dual-stripe magnetoresistive (DSMR) head for near-contact recording is investigated. Common mode rejection of thermally induced pulses is derived by a model incorporating manufacturing tolerance, and verified experimentally. The rejection ratio is at least 20 dB. Experiments also indicated that a DSMR can survive near-contact conditions without premature degradation
Keywords :
magnetic heads; magnetic recording noise; magnetoresistive devices; common mode rejection; dual-stripe magnetoresistive heads; manufacturing tolerance; near-contact recording; premature degradation; rejection ratio; thermally induced pulses; Disk recording; Error analysis; Hard disks; Magnetic heads; Magnetic resonance imaging; Magnetoresistance; Manufacturing industries; Temperature; Thermal degradation; Virtual manufacturing;
Journal_Title :
Magnetics, IEEE Transactions on
