• DocumentCode
    1384458
  • Title

    Measuring core losses in thin film heads

  • Author

    Payne, Alexander ; Cain, William ; Hempstead, Robert ; McCrea, Gary

  • Author_Institution
    Censtor Corp., San Jose, CA, USA
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3518
  • Lastpage
    3520
  • Abstract
    Increasing data rates are requiring magnetic transducers to perform at higher frequencies. “Core losses”-the combined effect of eddy current losses, damped domain wall motion, and decreasing rotation susceptibility, act to reduce yoke permeance at high frequencies. In this work, we describe a technique for measuring core loss and demonstrate its application to a variety of heads. The method involves least-squares fitting measured head impedance vs. frequency spectra to the response from an equivalent magnetic circuit having a complex and frequency-dependent inductance. The result is a description how the complex inductance varies with frequency, thereby characterizing the core loss
  • Keywords
    eddy current losses; equivalent circuits; inductance; least squares approximations; loss measurement; magnetic circuits; magnetic heads; magnetic leakage; magnetic thin film devices; magnetic variables measurement; complex frequency-dependent inductance; core loss measurement; damped domain wall motion; eddy current losses; equivalent magnetic circuit; head impedance/frequency spectra; least-squares fitting; magnetic transducers; rotation susceptibility; thin film heads; yoke permeance; Core loss; Eddy currents; Frequency; Inductance; Loss measurement; Magnetic domain walls; Magnetic domains; Magnetic heads; Transducers; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538676
  • Filename
    538676