• DocumentCode
    1384663
  • Title

    CLADISS-a longitudinal multimode model for the analysis of the static, dynamic, and stochastic behavior of diode lasers with distributed feedback

  • Author

    Vankwikelberge, Patrick ; Morthier, Geert ; Baets, Roel

  • Author_Institution
    Lab. of Electromagn. & Acoust., Ghent Univ., Belgium
  • Volume
    26
  • Issue
    10
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    1728
  • Lastpage
    1741
  • Abstract
    A computer model called CLADISS is presented for the analysis of multisection diode lasers. The model allows for the analysis of a wide variety of multisection devices with discrete or distributed internal reflections. The simulator can carry out a threshold, DC, AC, and a noise analysis. The threshold analysis determines the threshold of the various longitudinal modes of the laser. The power versus current and the wavelength versus current characteristics are found with the self-consistent DC analysis. CLADISS includes all of the longitudinal variations by dividing each laser section in many short segments. Both the optical field and carrier density are discretized according to this segmentation. To demonstrate the capabilities of CLADISS some nonlinear effects in DFB lasers are treated. Instabilities induced in the side-mode suppression ratio by spatial hole burning are considered. The effects of spatial hole burning and side modes on the FM response on the linewidth are discussed
  • Keywords
    distributed feedback lasers; laser modes; laser theory; optical hole burning; semiconductor device models; semiconductor junction lasers; AC analysis; CLADISS; DC analysis; DFB lasers; FM response; carrier density; computer model; diode lasers; discrete internal reflections; distributed feedback; distributed internal reflections; laser modes; laser section; lasing linewidth; longitudinal modes; longitudinal multimode model; multisection diode lasers; noise analysis; nonlinear effects; optical field; power versus current; side-mode suppression ratio; spatial hole burning; static laser behaviour; stochastic behavior; threshold analysis; wavelength versus current; Analytical models; Computational modeling; Diode lasers; Laser modes; Laser noise; Noise shaping; Nonlinear optics; Optical noise; Predictive models; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.60897
  • Filename
    60897