Title :
A new leadframe design solution for improved popcorn cracking performance
Author :
Lee, Charles ; Wong, Teck Chin ; Pape, Heinz
Author_Institution :
Semicond. Prod. Packaging Technol, Siemens Components Pte Ltd., Singapore
fDate :
3/1/1998 12:00:00 AM
Abstract :
A new leadframe design solution is proposed as one of the synergistic factors toward improving popcorn-cracking performance of plastic packages. The impact of the leadframe design on package stresses and thermal resistance was analyzed by finite element modeling (FEM) and further verified experimentally. An atomic force microscope (AFM) and the contact angle method were used to characterize surfaces before and after plasma cleaning. The new leadframe design was effective in reducing popcorn cracking sensitivity, package stresses, warpage and delamination. By incorporating the leadframe solution in a level 5 classified Cu-alloy leadframe 144L quad flat package (QFP), it was able to achieve a level 3 classification without plasma cleaning and changing of packaging materials. An AFM technique was used in a novel attempt to characterize surface cleanliness and to correlate with contact angle measurements
Keywords :
adhesion; atomic force microscopy; cracks; delamination; finite element analysis; integrated circuit packaging; plastic packaging; surface cleaning; thermal resistance; atomic force microscope; contact angle method; delamination; finite element modeling; leadframe design solution; level 3 classification; package stresses; plasma cleaning; plastic packages; popcorn cracking performance; quad flat package; surface cleanliness; synergistic factors; thermal resistance; warpage; Atomic force microscopy; Cleaning; Finite element methods; Lead; Plasma applications; Plasma measurements; Plastic packaging; Surface cracks; Thermal resistance; Thermal stresses;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on