Title :
The radiation response of a Selfoc microlens
Author :
Weiss, Jonathan D.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
fDate :
7/1/1990 12:00:00 AM
Abstract :
The radiation-induced darkening of SLW Selfoc microlenses at 810 nm is measured using 100-ns pulses from the Hermes II X-ray simulation machine. Their transmission loss versus total dose is displayed immediately after exposure and 45 μs later, up to a dose of about 32 krds
Keywords :
X-ray effects; fibre optics; lenses; optical testing; photochromism; 100 ns; 45 mus; 810 nm; Hermes II X-ray simulation machine; SLW Selfoc microlenses; Selfoc microlens; radiation response; radiation-induced darkening; total dose; transmission loss; Displays; Lenses; Microoptics; Optical buffering; Optical fibers; Optical filters; Optical pulses; Oscilloscopes; Photodetectors; Pulse measurements;
Journal_Title :
Lightwave Technology, Journal of
