DocumentCode
1384806
Title
Theoretical study of a classically confined solid-state photomultiplier
Author
Wang, Yang ; Brennan, Kevin F.
Author_Institution
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
26
Issue
10
fYear
1990
fDate
10/1/1990 12:00:00 AM
Firstpage
1838
Lastpage
1844
Abstract
A detailed theoretical analysis is presented of the workings of a new solid-state photomultiplier whose gain is derived through impact excitation events of classically confined electrons out of thin semiconductor layers. The highly doped layers containing the target or ionizing electrons are made sufficiently wide so as to avoid spatial quantization effects. The primary difference of this scheme is due to the different k vector conservation requirement implicit in confined quantum state devices. The calculations presented serve as a lower bound on the gain of a confined electron state photomultiplier. However, owing to the classical confinement, the dark currents, due to both thermionic emission and tunneling, are substantially lower, by several orders of magnitude, than that in a quantum confined device. Calculations of the ionization probability, average ionization rate, gain, dark current, and mean thermalization distance are presented
Keywords
photoconducting devices; photomultipliers; semiconductor thin films; thermionic emission; tunnelling; average ionization rate; classically confined electrons; classically confined solid-state photomultiplier; confined electron state photomultiplier; confined quantum state devices; dark currents; highly doped layers; impact excitation events; ionization probability; ionizing electrons; k vector conservation requirement; lower bound; mean thermalization distance; photomultiplier gain; thermionic emission; thin semiconductor layers; tunneling; Dark current; Electrons; Ionization; Photomultipliers; Potential well; Probability; Quantization; Solid state circuits; Thermionic emission; Tunneling;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.60910
Filename
60910
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