• DocumentCode
    1384819
  • Title

    Surface roughness and contact angle of bias sputtered CoCrTa film

  • Author

    Chandrasekhar, R. ; Mapps, D.J. ; Blunt, L.

  • Author_Institution
    Centre for Res. in Inf. Storage Technol., Univ. of Plymouth, Devon, UK
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3681
  • Lastpage
    3683
  • Abstract
    Surface roughness of bias sputtered CoCrTa films on glass substrates were studied using an Atomic Force Microscope (AFM) and an interferometer (non contact) optical technique (IOT). Contact angles of the coated disks were measured using a goniometer microscope. Wear tests were performed on the bias sputtered films. The results of these investigations are presented
  • Keywords
    atomic force microscopy; chromium alloys; cobalt alloys; contact angle; light interferometry; magnetic thin films; sputtered coatings; surface topography; tantalum alloys; wear; CoCrTa; atomic force microscopy; bias sputtered CoCrTa film; contact angle; glass substrate; goniometer microscopy; noncontact interferometer optical technique; surface roughness; wear; Atom optics; Atomic force microscopy; Atomic measurements; Glass; Optical films; Optical interferometry; Optical microscopy; Rough surfaces; Substrates; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538727
  • Filename
    538727
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1384819