DocumentCode :
1384844
Title :
Time-Domain Algorithm for Locating Evolving Faults
Author :
Kulkarni, Saurabh ; Santoso, Surya
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
Volume :
3
Issue :
4
fYear :
2012
Firstpage :
1584
Lastpage :
1593
Abstract :
Evolving faults are faults beginning in one phase of a distribution circuit and spreading to another phase after a few cycles. This paper develops a time-domain algorithm for estimating the location of such faults. The algorithm is divided into two parts, namely, the single line-to-ground portion of the fault and the line-to-line-to-ground portion of the fault. The arc voltage that exists during faults is taken into consideration while deriving this methodology. For the single line-to-ground portion of the fault, the distance to the fault is estimated in terms of the loop or self-reactance between the monitor and the fault. On the other hand, for the line-to-line-to-ground and line-to-line portion of the fault the distance is estimated in terms of the positive-sequence reactance. The reactance-to-fault estimate is more robust than that of the resistance-to-fault, because it is unaffected by fault resistance. Two evolving fault cases and two line-to-line fault cases are analyzed in detail and the error in the location estimates is found to be below 10% in each case. Ten additional cases are analyzed and linear regression analysis is conducted to demonstrate the accuracy of the fault location estimates.
Keywords :
fault location; power distribution faults; power distribution protection; arc voltage; distribution circuit; fault location; line-to-line fault; line-to-line-to-ground fault; locating evolving faults; single line-to-ground fault; time-domain algorithm; Circuit faults; Equations; Fault location; Impedance; Monitoring; Time domain analysis; Voltage measurement; Fault location; fault diagnosis; power distribution faults; time-domain analysis;
fLanguage :
English
Journal_Title :
Smart Grid, IEEE Transactions on
Publisher :
ieee
ISSN :
1949-3053
Type :
jour
DOI :
10.1109/TSG.2012.2207469
Filename :
6376271
Link To Document :
بازگشت