• DocumentCode
    1384871
  • Title

    The future: plug and pray?

  • Author

    Maunder, Colin

  • Author_Institution
    British Telecom Res. Labs., Ipswich, UK
  • Volume
    15
  • Issue
    2
  • fYear
    1998
  • Firstpage
    8
  • Lastpage
    13
  • Abstract
    In his keynote speech at the 1998 International Test Conference, held last November in Washington, D.C., the author presented a view of our increasing dependence on electronic systems and the impact this is likely to have on the way we design and test new products. Here, he summarizes his major points
  • Keywords
    electronic equipment testing; logic testing; technological forecasting; International Test Conference; design; electronic systems; test; Circuit testing; Electronic equipment testing; Engineering profession; Integrated circuit testing; Market opportunities; Moore´s Law; Pediatrics; Plugs; Production planning; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.679203
  • Filename
    679203
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1384871