Title :
Control and observation structures for analog circuits
Author :
Yeong-Ruey Sheh ; Wu, Cheng-Wen
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy
Keywords :
built-in self test; calibration; design for testability; DC voltage levels; analog circuits; built-in self-test method; calibration process; control structures; observation structures; Analog circuits; Analog memory; Automatic testing; Built-in self-test; Calibration; Circuit testing; Digital circuits; Hardware; Signal resolution; Switches;
Journal_Title :
Design & Test of Computers, IEEE
