• DocumentCode
    1385087
  • Title

    Parametric modeling of a microaccelerometer: comparing I- and D-optimal design of experiments for finite-element analysis

  • Author

    Gianchandani, Yogesh B. ; Crary, Selden B.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    274
  • Lastpage
    282
  • Abstract
    Parametric modeling of a microaccelerometer is used to compare two optimization criteria in the design of experiments for finite-element analysis (FEA). I- and D-optimality criteria are used to specify a near-minimal set of 38 input points in multidimensional input space at which FEA is performed. The accelerometer is comprised of a rigid proof mass and four suspension beams. Its response is determined as a function of acceleration along the input and cross axes, temperature, and two structural variables, and the related performance compromises are identified. It is shown that both I- and D-optimality criteria provide good results, with displacement residuals spread over ranges of magnitude 1.6 and 2.3 μm, respectively, in a large input domain over which the range of displacement has a magnitude exceeding 13 μm. Additionally, the results suggest that for the particular device that was considered, the temperature coefficients of offset and sensitivity have smaller magnitudes when the suspension beams are attached near the center of each side of the proof mass
  • Keywords
    accelerometers; design of experiments; finite element analysis; microsensors; modelling; optimisation; D-optimal design of experiments; FEA; I-optimal design of experiments; displacement residuals; finite-element analysis; microaccelerometer; multidimensional input space; offset; optimization criteria comparison; parametric modeling; rigid proof mass; sensitivity; suspension beams; temperature coefficients; Accelerometers; Computer errors; Computer simulation; Design optimization; Finite element methods; Parametric statistics; Performance analysis; Stochastic resonance; Temperature sensors; US Department of Energy;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.679399
  • Filename
    679399