DocumentCode
1385087
Title
Parametric modeling of a microaccelerometer: comparing I- and D-optimal design of experiments for finite-element analysis
Author
Gianchandani, Yogesh B. ; Crary, Selden B.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume
7
Issue
2
fYear
1998
fDate
6/1/1998 12:00:00 AM
Firstpage
274
Lastpage
282
Abstract
Parametric modeling of a microaccelerometer is used to compare two optimization criteria in the design of experiments for finite-element analysis (FEA). I- and D-optimality criteria are used to specify a near-minimal set of 38 input points in multidimensional input space at which FEA is performed. The accelerometer is comprised of a rigid proof mass and four suspension beams. Its response is determined as a function of acceleration along the input and cross axes, temperature, and two structural variables, and the related performance compromises are identified. It is shown that both I- and D-optimality criteria provide good results, with displacement residuals spread over ranges of magnitude 1.6 and 2.3 μm, respectively, in a large input domain over which the range of displacement has a magnitude exceeding 13 μm. Additionally, the results suggest that for the particular device that was considered, the temperature coefficients of offset and sensitivity have smaller magnitudes when the suspension beams are attached near the center of each side of the proof mass
Keywords
accelerometers; design of experiments; finite element analysis; microsensors; modelling; optimisation; D-optimal design of experiments; FEA; I-optimal design of experiments; displacement residuals; finite-element analysis; microaccelerometer; multidimensional input space; offset; optimization criteria comparison; parametric modeling; rigid proof mass; sensitivity; suspension beams; temperature coefficients; Accelerometers; Computer errors; Computer simulation; Design optimization; Finite element methods; Parametric statistics; Performance analysis; Stochastic resonance; Temperature sensors; US Department of Energy;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/84.679399
Filename
679399
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