DocumentCode
1385225
Title
Improving conduction and mechanical reliability of woven metal interconnects
Author
Bhattacharya, Rabin ; Van Pieterson, Liesbeth ; Van Os, Koen
Author_Institution
Dept. of Lighting & Cleantech Incubator, Inst. of Philips Res., Eindhoven, Netherlands
Volume
2
Issue
1
fYear
2012
Firstpage
165
Lastpage
168
Abstract
We present a simple fabrication process that produces reliable electronic textile backplanes. We electroplate copper onto woven conductive yarns in order to improve the yarn´s conductivity as well as the reliability of electrical contact points between the conductive warp and weft yarns. This process improves the electrical performance of the woven yarns and of the warp/weft contacts by a factor of 1.22 and 3.63, respectively. Also, in mechanical tests, the electroplated textiles show improved electrical performance when subjected to mechanical strain. Furthermore, we use this process to mount electronic submounts onto the textile substrate on top of which electronic components could be easily connected, thereby creating an electronic textile backplane.
Keywords
electroplated coatings; reliability; textiles; woven composites; conduction reliability; electronic submounts; electronic textile backplanes; electroplate copper; fabrication process; mechanical reliability; woven conductive yarns; woven metal interconnects; Contacts; Copper; Resistance; Substrates; Weaving; Yarn; Electronic textile; interconnect; plating; reliability;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2171041
Filename
6092472
Link To Document