• DocumentCode
    1385225
  • Title

    Improving conduction and mechanical reliability of woven metal interconnects

  • Author

    Bhattacharya, Rabin ; Van Pieterson, Liesbeth ; Van Os, Koen

  • Author_Institution
    Dept. of Lighting & Cleantech Incubator, Inst. of Philips Res., Eindhoven, Netherlands
  • Volume
    2
  • Issue
    1
  • fYear
    2012
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    We present a simple fabrication process that produces reliable electronic textile backplanes. We electroplate copper onto woven conductive yarns in order to improve the yarn´s conductivity as well as the reliability of electrical contact points between the conductive warp and weft yarns. This process improves the electrical performance of the woven yarns and of the warp/weft contacts by a factor of 1.22 and 3.63, respectively. Also, in mechanical tests, the electroplated textiles show improved electrical performance when subjected to mechanical strain. Furthermore, we use this process to mount electronic submounts onto the textile substrate on top of which electronic components could be easily connected, thereby creating an electronic textile backplane.
  • Keywords
    electroplated coatings; reliability; textiles; woven composites; conduction reliability; electronic submounts; electronic textile backplanes; electroplate copper; fabrication process; mechanical reliability; woven conductive yarns; woven metal interconnects; Contacts; Copper; Resistance; Substrates; Weaving; Yarn; Electronic textile; interconnect; plating; reliability;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2171041
  • Filename
    6092472