• DocumentCode
    1385227
  • Title

    Digital Calibration of Capacitor Mismatch in Sigma-Delta Modulators

  • Author

    Lee, Seung-Chul ; Chiu, Yun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    58
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    690
  • Lastpage
    698
  • Abstract
    This paper presents a capacitor mismatch calibration technique in multibit discrete-time sigma-delta (ΣΔ) modulators based on a capacitor error model, including nonideal integrator gain errors. This model enables the compensation of mismatch-induced nonlinear memory errors in conversion using a simple flnite impulse-response structure. Single-bit pseudorandom noise (PN) is utilized to identify the error coefficients, and an analog-domain PN removal technique is devised to minimize the input signal dynamic-range loss due to the PN circulation in the ΣΔ loop. The behavioral simulation demonstrates that the proposed scheme effectively compensates for the multibit capacitor mismatch errors in the first- and second-order ΣΔ modulators.
  • Keywords
    calibration; capacitors; digital circuits; sigma-delta modulation; capacitor error model; capacitor mismatch; digital calibration; finite impulse-response structure; nonideal integrator gain errors; sigma-delta modulators; single-bit pseudorandom noise; Calibration; Capacitors; Dynamic range; Mathematical model; Modulation; Noise; Switches; $Sigma Delta$ modulator; adaptive digital calibration; analog-to-digital converter (ADC); capacitor mismatch; digital-to-analog converter (DAC); nonlinearity; test signal;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2010.2073870
  • Filename
    5641627