DocumentCode :
1385227
Title :
Digital Calibration of Capacitor Mismatch in Sigma-Delta Modulators
Author :
Lee, Seung-Chul ; Chiu, Yun
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume :
58
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
690
Lastpage :
698
Abstract :
This paper presents a capacitor mismatch calibration technique in multibit discrete-time sigma-delta (ΣΔ) modulators based on a capacitor error model, including nonideal integrator gain errors. This model enables the compensation of mismatch-induced nonlinear memory errors in conversion using a simple flnite impulse-response structure. Single-bit pseudorandom noise (PN) is utilized to identify the error coefficients, and an analog-domain PN removal technique is devised to minimize the input signal dynamic-range loss due to the PN circulation in the ΣΔ loop. The behavioral simulation demonstrates that the proposed scheme effectively compensates for the multibit capacitor mismatch errors in the first- and second-order ΣΔ modulators.
Keywords :
calibration; capacitors; digital circuits; sigma-delta modulation; capacitor error model; capacitor mismatch; digital calibration; finite impulse-response structure; nonideal integrator gain errors; sigma-delta modulators; single-bit pseudorandom noise; Calibration; Capacitors; Dynamic range; Mathematical model; Modulation; Noise; Switches; $Sigma Delta$ modulator; adaptive digital calibration; analog-to-digital converter (ADC); capacitor mismatch; digital-to-analog converter (DAC); nonlinearity; test signal;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2010.2073870
Filename :
5641627
Link To Document :
بازگشت