Title :
Investigation of head wear and contamination in helical scan tape systems
Author :
Kim, Sookyung ; Prabhakaran, Vijay ; Talk, Frank E.
Author_Institution :
Dept. of Appl. Mech. & Eng. Sci., California Univ., San Diego, La Jolla, CA, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
The wear behavior of helical scan recorder heads is studied using the micro-indentation technique, where Vickers micro-indentations are spatially distributed on the head surface to provide a scale for wear measurement as a function of position. Atomic Force Microscopy is used to measure the wear rates with high accuracy. The maximum wear occurs in the trailing pole piece of the head. The MP tape proved to be more abrasive than the γFe2O3 tape. Chemical analysis of films forming in the glass region indicated iron oxide transfer from the tape to the head surface
Keywords :
atomic force microscopy; magnetic heads; magnetic recording; magnetic tape equipment; surface contamination; wear; γ-Fe2O3 tape; Fe2O3; MP tape; Vickers micro-indentation; atomic force microscopy; chemical analysis; contamination; helical scan tape recorder; magnetic head; wear; Abrasives; Atomic force microscopy; Atomic measurements; Chemical analysis; Force measurement; Glass; Magnetic heads; Pollution measurement; Position measurement; Surface contamination;
Journal_Title :
Magnetics, IEEE Transactions on
