DocumentCode :
1385349
Title :
A new wear measurement technique for pseudo-contact magnetic recording heads
Author :
Hsia, Yiao-Tee ; Rottmayer, Robert ; Donovan, Mark J.
Author_Institution :
Read-Rite Corp., Fremont, CA, USA
Volume :
32
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
3750
Lastpage :
3752
Abstract :
Pseudo-Contact magnetic recording sliders remain in contact with the disk even at operating speeds. The continuous contact can cause wear of the interface that might eventually lead to failure of the drive. In order to evaluate the long term reliability, precise measurements of the slider wear are necessary. In this paper, a new method of measuring the depth and location of wear on the slider is described. Fiduciary marks are created on the slider air-bearing surface using a focused ion beam (FIB). These FIB marks are characterized using an AFM before and after a wear test. The technique allows measurement of wear depths within an accuracy of ±1 nm. Some additional techniques for detecting slider wear are described
Keywords :
atomic force microscopy; focused ion beam technology; magnetic heads; magnetic recording; mechanical variables measurement; wear testing; AFM; device failure; disk; fiduciary mark; focused ion beam; pseudo-contact magnetic recording head; reliability; slider; wear measurement; Cascading style sheets; Magnetic heads; Magnetic recording; Manufacturing processes; Measurement techniques; Position measurement; Rough surfaces; Surface roughness; Testing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.538825
Filename :
538825
Link To Document :
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