Title :
A data acquisition and analysis system for voltage versus luminous intensity transfer characteristic measurements in flat panel displays
Author_Institution :
Dept. of Electr. & Electron. Eng., Ulster Univ., Newtownabbey
fDate :
6/1/1991 12:00:00 AM
Abstract :
In this study the time domain transfer function h(t ) of luminescent display panels has been determined for the first time by the cross-correlation technique. The signature of the impulse response is immediately useful as a research tool and has potential application in the control of manufacturing process parameters. A prototype data acquisition and analysis system was designed and constructed. The system was interfaced to a Thorn EMI 9813 photomultiplier. The primary application of the system, in this case, was to measure the forward transfer characteristics of ZnS:Mn,Cu DCEL (DC electroluminescence) pixels. The system employs cross-correlation techniques based on a 1023, PRBS (pseudo random binary sequence) maximal length sequence with a bit rate of 50 kHz. The digitized luminous output is temporarily stored in static RAM. The data is subsequently transferred to a microcomputer where h(t) is derived by a cross-correlation algorithm
Keywords :
II-VI semiconductors; computerised instrumentation; data acquisition; electroluminescent displays; electronic equipment testing; flat panel displays; microcomputer applications; zinc compounds; 50 kHz; DC electroluminescence; Thorn EMI 9813 photomultiplier; ZnS:Cu; ZnS:Mn; cross-correlation; data acquisition; data analysis; digitized luminous output; flat panel displays; forward transfer characteristics; impulse response; luminescent display panels; luminous intensity transfer characteristic measurements; microcomputer; pseudo random binary sequence; time domain transfer function; voltage dependence; Data acquisition; Data analysis; Displays; Electromagnetic interference; Manufacturing processes; Photomultipliers; Process control; Prototypes; Transfer functions; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on