DocumentCode
1385680
Title
On the shot effect of p-n junctions
Author
Anderson, Richard L. ; van der Ziel, A.
Author_Institution
Dept. of Electrical Engineering, University of Minnesota; I.B.M. Corporation, Poughskeepsie, New York
Issue
1
fYear
1952
Firstpage
20
Lastpage
24
Abstract
Noise measurements on two p-n junctions, biased in the forward direction, have been carried out between 1 kc and 64 kc for a wide range of currents (0–1000 μA). Several other properties of the junction which might help in interpreting our noise data were also measured. Both junctions were almost identical.
Keywords
Current measurement; Electrical resistance measurement; Noise; P-n junctions; Resistance; Temperature measurement;
fLanguage
English
Journal_Title
Electron Devices, Transactions of the IRE Professional Group on
Publisher
ieee
ISSN
0197-6370
Type
jour
DOI
10.1109/IREPGED.1952.6811054
Filename
6811054
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