• DocumentCode
    1385707
  • Title

    Transistor characteristics

  • Author

    Zeidler, H.M.

  • Author_Institution
    Stanford Research Institute Stanford, California
  • Issue
    2
  • fYear
    1953
  • Firstpage
    2
  • Lastpage
    10
  • Abstract
    The development of the transistor is undoubtedly one of the most significant contributions in the field of electronic components. Many organizations have established extensive projects for the development of transistor circuits, and practical applications will certainly be reported in increasing numbers in the near future. In order to lay the foundation for transistor circuit development at the Stanford Research Institute, an internally-sponsored project was initiated in December 1951 for investigation of the characteristics of point-contact transistors. Some of the results of the work of that project are presented in this paper.
  • Keywords
    Current measurement; Heating; Resistance; Temperature; Temperature measurement; Transistors; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, Transactions of the IRE Professional Group on
  • Publisher
    ieee
  • ISSN
    0197-6370
  • Type

    jour

  • DOI
    10.1109/IREPGED.1953.6811059
  • Filename
    6811059