• DocumentCode
    1385749
  • Title

    Circuit/device modeling at the quantum level

  • Author

    Yu, Zhiping ; Dutton, Robert W. ; Kiehl, Richard A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1819
  • Lastpage
    1825
  • Abstract
    Quantum mechanical (QM) effects, which manifest when the device dimensions are comparable to the de Broglie wavelength, are becoming common physical phenomena in the current micro-/nano-meter technology era. While most novel devices take advantage of QM effects to achieve fast switching speed, miniature size, and extremely small power consumption, the mainstream CMOS devices (with the exception of EEPROMs) are generally suffering in performance from these effects. Solutions to minimize the adverse effects caused by QM while keeping the downscaling trend (technology feasibility aside) are being sought in the research community and industry-wide. This paper presents a perspective view of modeling approaches to quantum mechanical effects in solid-state devices at the device and circuit simulation levels. Specifically, the macroscopic modeling of silicon devices to include QM corrections in the classical transport framework is discussed. Both device and circuit models will be provided. On the quantum devices, such as the single electron junctions and transistors, the emphasis is placed on the principle of logic circuit operation
  • Keywords
    CMOS integrated circuits; circuit simulation; nanotechnology; quantum theory; semiconductor device models; single electron transistors; circuit simulation level; classical transport framework; de Broglie wavelength; device modeling; downscaling trend; logic circuit operation; macroscopic modeling; nanometer technology; power consumption; quantum level; quantum mechanical effects; single electron transistors; switching speed; CMOS technology; Circuit simulation; EPROM; Energy consumption; Matter waves; Nanoscale devices; Quantum mechanics; Semiconductor device modeling; Solid modeling; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.870554
  • Filename
    870554