Title :
Magnetic properties of c-axis textured Nd2Fe14B thin films
Author :
Keavney, D.J. ; Fullerton, Eric E. ; Pearson, J.E. ; Bader, S.D.
Author_Institution :
Div. of Mater. Sci., Argonne Nat. Lab., IL, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
Thin films of Nd2Fe14B (~30-60 nm) were grown with c-axis texture by means of molecular beam epitaxy. A two-phase structure is observed in both the X-ray diffraction and the hysteresis loops, due to an interfacial reaction during the initial growth. Coercivities are 1-2 T at 20 K, and the anisotropy fields are bulk-like. Microstructural analysis by atomic and magnetic force microscopies reveal lateral grain sizes of ~200 nm, which could explain the hard magnetic properties
Keywords :
X-ray diffraction; atomic force microscopy; boron alloys; coercive force; ferromagnetic materials; grain size; iron alloys; magnetic anisotropy; magnetic epitaxial layers; magnetic force microscopy; magnetic hysteresis; neodymium alloys; permanent magnets; texture; 20 K; 200 nm; Nd2Fe14B; X-ray diffraction; anisotropy fields; atomic force microscopy; c-axis textured Nd2Fe14B thin films; coercivities; hard magnetic properties; hysteresis loops; interfacial reaction; lateral grain sizes; magnetic force microscopy; magnetic properties; microstructural analysis; molecular beam epitaxy; two-phase structure; Anisotropic magnetoresistance; Coercive force; Iron; Magnetic analysis; Magnetic hysteresis; Magnetic properties; Molecular beam epitaxial growth; Neodymium; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
