• DocumentCode
    1385814
  • Title

    Monte Carlo simulation of noncubic symmetry semiconducting materials and devices

  • Author

    Brennan, Kevin F. ; Bellotti, Enrico ; Farahmand, Maziar ; Nilsson, Hans-Erik ; Ruden, P.Paul ; Zhang, Yumin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1882
  • Lastpage
    1890
  • Abstract
    In this paper, we discuss the complexities that arise in Monte Carlo based modeling of noncubic symmetry semiconductors and their related devices. We have identified three general issues, band structure, scattering mechanisms, and band intersections that require some modification of the Monte Carlo simulator from that for cubic symmetry. Owing to the increased size and number of atoms per unit cell, the band structure is far more complex in noncubic than in zincblende phase semiconductors. This added complexity is reflected by the greater number of bands, smaller Brillouin zone and concomitant increase in the number of band intersections. We present strategies for modeling the effects of band intersections on the carrier dynamics using the Monte Carlo method. It is found that the band intersection points greatly affect the carrier transport, most dramatically in the determination of the impact ionization and breakdown properties of devices and bulk material. Excellent agreement with experimental measurements of the impact ionization coefficients is obtained only when treatment of the band intersections is included within the model
  • Keywords
    Brillouin zones; Monte Carlo methods; band structure; crystal symmetry; impact ionisation; semiconductor device models; wide band gap semiconductors; Brillouin zone; Monte Carlo simulation; band intersection; band structure; carrier dynamics; carrier scattering; carrier transport; electric breakdown; impact ionization; noncubic symmetry; semiconducting device model; wide band gap semiconducting material; Electric breakdown; Impact ionization; Monte Carlo methods; Photonic band gap; Semiconductivity; Semiconductor materials; Silicon; Temperature; Thermal conductivity; Wideband;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.870567
  • Filename
    870567