DocumentCode
1385814
Title
Monte Carlo simulation of noncubic symmetry semiconducting materials and devices
Author
Brennan, Kevin F. ; Bellotti, Enrico ; Farahmand, Maziar ; Nilsson, Hans-Erik ; Ruden, P.Paul ; Zhang, Yumin
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Tech., Atlanta, GA, USA
Volume
47
Issue
10
fYear
2000
fDate
10/1/2000 12:00:00 AM
Firstpage
1882
Lastpage
1890
Abstract
In this paper, we discuss the complexities that arise in Monte Carlo based modeling of noncubic symmetry semiconductors and their related devices. We have identified three general issues, band structure, scattering mechanisms, and band intersections that require some modification of the Monte Carlo simulator from that for cubic symmetry. Owing to the increased size and number of atoms per unit cell, the band structure is far more complex in noncubic than in zincblende phase semiconductors. This added complexity is reflected by the greater number of bands, smaller Brillouin zone and concomitant increase in the number of band intersections. We present strategies for modeling the effects of band intersections on the carrier dynamics using the Monte Carlo method. It is found that the band intersection points greatly affect the carrier transport, most dramatically in the determination of the impact ionization and breakdown properties of devices and bulk material. Excellent agreement with experimental measurements of the impact ionization coefficients is obtained only when treatment of the band intersections is included within the model
Keywords
Brillouin zones; Monte Carlo methods; band structure; crystal symmetry; impact ionisation; semiconductor device models; wide band gap semiconductors; Brillouin zone; Monte Carlo simulation; band intersection; band structure; carrier dynamics; carrier scattering; carrier transport; electric breakdown; impact ionization; noncubic symmetry; semiconducting device model; wide band gap semiconducting material; Electric breakdown; Impact ionization; Monte Carlo methods; Photonic band gap; Semiconductivity; Semiconductor materials; Silicon; Temperature; Thermal conductivity; Wideband;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.870567
Filename
870567
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