DocumentCode :
1385840
Title :
Hybrid fullband cellular automaton/Monte Carlo approach for fast simulation of charge transport in semiconductors
Author :
Saraniti, Marco ; Goodnick, Stephen M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Volume :
47
Issue :
10
fYear :
2000
fDate :
10/1/2000 12:00:00 AM
Firstpage :
1909
Lastpage :
1916
Abstract :
We present a fullband cellular automaton (CA) code for simulation of electron and hole transport in Si and GaAs. In this implementation, the entire Brillouin zone is discretized using a nonuniform mesh in k-space, and a transition table is generated between all initial and final states on the mesh, greatly simplifying the final state selection of the conventional Monte Carlo algorithm. This method allows for fully anisotropic scattering rates within the fullband scheme, at the cost of increased memory requirements for the transition table itself. Good agreement is obtained between the CA model and previously reported results for the velocity-field characteristics and high field distribution function, which illustrate the potential accuracy of the technique. A hybrid CA/Monte Carlo algorithm is introduced which helps alleviate the memory problems of the CA method while preserving the speed up and accuracy
Keywords :
Brillouin zones; Monte Carlo methods; cellular automata; electronic engineering computing; gallium arsenide; scattering; semiconductors; silicon; transport processes; Brillouin zone discretization; GaAs; Monte Carlo algorithm; Si; charge transport; electron transport; fast simulation; fullband cellular automaton code; fully anisotropic scattering rates; hole transport; hybrid fullband CA/Monte Carlo approach; nonuniform mesh; semiconductors; state selection; transition table generation; Anisotropic magnetoresistance; Automata; Brillouin scattering; Computational modeling; Costs; Electromagnetic compatibility; Mesh generation; Monte Carlo methods; Particle scattering; Phonons;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.870571
Filename :
870571
Link To Document :
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