Title :
Generating test data with enhanced context-free grammars
Author :
Maurer, Peter M.
Author_Institution :
Univ. of South Florida, Tampa, FL, USA
fDate :
7/1/1990 12:00:00 AM
Abstract :
The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author´s experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.<>
Keywords :
VLSI; context-free grammars; integrated circuit testing; VLSI circuit simulators; context-free grammars; debug; functional testing; systematic tests; test data generation; testing subroutines; very-large-scale integrated circuits; Circuit simulation; Circuit testing; Computer bugs; Electronic equipment testing; Hardware; Programming profession; Software quality; Software testing; System testing; Very large scale integration;
Journal_Title :
Software, IEEE
