DocumentCode :
1386143
Title :
Study on the Ni–Re–Ir Sponge Oxide Cathode
Author :
Wang, Xiaoxia ; Liao, Xianheng ; Luo, Jirun ; Zhao, Qinglan ; Zhang, Min ; Wang, Qifu ; Li, Yun
Author_Institution :
Key Lab. of High Power Microwave Sources & Technol., Inst. of Electron., Beijing, China
Volume :
59
Issue :
2
fYear :
2012
Firstpage :
491
Lastpage :
495
Abstract :
In order to improve the emission performance and reliability of the oxide cathode for application in a microwave tube, an Ni-Re-Ir sponge reservoir oxide cathode has been developed and is presented in this paper. The emission current, the activity during lifetime, the emission uniformity, and the work function have been tested. The results show that the emission current of the cathode reaches 16 A/cm2 with a 10-μs pulsewidth and a 1% duty cycle and that the emission current, after 3000-h lifetime at a temperature of 820 °C br, has decreased less than 5% with 1- A/cm2 direct current. The analysis and test results of the thermal electron spectrometer indicate that the emission uniformity of the cathode can be improved to ensure that more than 80% of the cathode work-function distribution is in the range of 1.44-1.5 eV. The cathode has been successfully used many times in a miniature grid-controlled pulsed travelling wave tube for the launch of a manned space craft and a communication satellite.
Keywords :
cathodes; iridium compounds; microwave tubes; nickel compounds; reliability; rhenium compounds; space vehicles; spectrometers; NiReIrO; cathode work-function distribution; communication satellite; duty cycle; emission current; emission performance; emission uniformity; manned space craft; microwave tube; miniature grid-controlled pulsed travelling wave tube; oxide cathode reliability; sponge reservoir oxide cathode; temperature 820 degC; thermal electron spectrometer; Cathodes; Educational institutions; Materials; Microwave theory and techniques; Nickel; Reservoirs; Testing; Emission performance; Ni–Re–Ir sponge; oxide cathode; thermal electron spectrometer;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2173689
Filename :
6093744
Link To Document :
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