• DocumentCode
    1386153
  • Title

    A 45 nm SOI Embedded DRAM Macro for the POWER™ Processor 32 MByte On-Chip L3 Cache

  • Author

    Barth, John ; Plass, Don ; Nelson, Erik ; Hwang, Charlie ; Fredeman, Gregory ; Sperling, Michael ; Mathews, Abraham ; Kirihata, Toshiaki ; Reohr, William R. ; Nair, Kavita ; Cao, Nianzheng

  • Author_Institution
    Technol. Group, IBM Syst., Burlington, VT, USA
  • Volume
    46
  • Issue
    1
  • fYear
    2011
  • Firstpage
    64
  • Lastpage
    75
  • Abstract
    A 1.35 ns random access and 1.7 ns-random-cycle SOI embedded-DRAM macro has been developed for the POWER7™ high-performance microprocessor. The macro employs a 6 transistor micro sense-amplifier architecture with extended precharge scheme to enhance the sensing margin for product quality. The detailed study shows a 67% bit-line power reduction with only 1.7% area overhead, while improving a read zero margin by more than 500ps. The array voltage window is improved by the programmable BL voltage generator, allowing the embedded DRAM to operate reliably without constraining of the microprocessor voltage supply windows. The 2.5nm gate oxide transistor cell with deep-trench capacitor is accessed by the 1.7 V wordline high voltage (VPP) with V WL low voltage (VWL), and both are generated internally within the microprocessor. This results in a 32 MB on-chip L3 on-chip-cache for 8 cores in a 567 mm POWER7™ die.
  • Keywords
    cache storage; microprocessor chips; random-access storage; silicon-on-insulator; 6 transistor micro sense-amplifier architecture; POWER processor; POWER7 high-performance microprocessor; SOI embedded DRAM macro; SOI embedded-DRAM macro; deep-trench capacitor; extended precharge scheme; microprocessor voltage supply windows; on-chip L3 cache; product quality; programmable BL voltage generator; random access; sensing margin; size 45 nm; Arrays; Couplings; Metals; Microprocessors; Random access memory; System-on-a-chip; DRAM Macro; embedded DRAM Cache;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2084470
  • Filename
    5643084