DocumentCode :
1386199
Title :
A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM With 2.5 ns Bank to Bank Active Time and No Bank Group Restriction
Author :
Oh, Tae-Young ; Sohn, Young-Soo ; Bae, Seung-Jun ; Park, Min-Sang ; Lim, Ji-Hoon ; Cho, Yong-Ki ; Kim, Dae-Hyun ; Kim, Dong-Min ; Kim, Hye-Ran ; Kim, Hyun-Joong ; Kim, Jin-Hyun ; Kim, Jin-Kook ; Kim, Young-Sik ; Kim, Byeong-Cheol ; Kwak, Sang-Hyup ; Lee,
Author_Institution :
Samsung Electron., South Korea
Volume :
46
Issue :
1
fYear :
2011
Firstpage :
107
Lastpage :
118
Abstract :
This paper describes a 1 Gbit GDDR5 SDRAM with enhanced bank access flexibility for efficient data transfer in 7 Gb/s per pin IO bandwidth. The enhanced flexibility is achieved by elimination of bank group restriction and reduction of bank to bank active time to 2.5 ns. The effectiveness of these key features is verified by system model simulation including memory and its controller. To realize the enhanced bank access flexibility, this DRAM employs the following techniques: skewed control logic, PVT variation compensated IO sense amplifier with auto calibration by replica impedance monitor, FIFO based BLSA enable signal generator, low latency VPP generator and active jitter canceller. This GDDR5 SDRAM was fabricated in 50 nm standard DRAM process in 61.6 die area and operates with 1.5 V power supply.
Keywords :
DRAM chips; FIFO based BLSA; GDDR5 SDRAM; IO sense amplifier; VPP generator; active jitter canceller; auto calibration; bank access flexibility; bank group restriction; data transfer; replica impedance monitor; signal generator; size 50 nm; skewed control logic; standard DRAM process; system model simulation; time 2.5 ns; voltage 1.5 V; Bandwidth; Delay; Generators; Impedance; SDRAM; Transistors; Active jitter canceller; GDDR5; IO sense amplifier auto calibration; bank group; bank to bank active time; bitline sense amplifier enable; core cycle; low latency VPP generator; page hit rate; replica impedance monitor; skewed logic; tRRD;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2085991
Filename :
5643091
Link To Document :
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