DocumentCode
1386288
Title
Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
Author
d´Ambrosio, C. ; Leutz, H.
Author_Institution
CERN, Geneva, Switzerland
Volume
47
Issue
4
fYear
2000
fDate
8/1/2000 12:00:00 AM
Firstpage
1685
Lastpage
1690
Abstract
The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient μ, the average number of photoelectrons N¯phel emitted from the photocathode, and on the distribution of the fractional photoelectron energy q absorbed in silicon during the backscattering process. We obtained the following results: the average number of absorbed (measured) photoelectrons N¯meas in the silicon anode amounts to ~88% of the incident N¯phel. Photoelectron- and gamma-absorption peaks are broadened by a factor 1.043 due to backscattering. As an example, for photomultiplier tubes, this broadening can amount to an average factor of 1.18 due to statistic and gain fluctuations on the dynode chain
Keywords
anodes; electron backscattering; elemental semiconductors; gamma-ray absorption; gamma-ray detection; photodetectors; photomultipliers; silicon; solid scintillation detectors; Si; dynode chain; fractional photoelectron energy; gamma-absorption peaks; hybrid photodetector tubes anodes; photoelectron backscattering; photomultiplier tubes; solid scintillation detectors; spectral distributions; Anodes; Backscatter; Cathodes; Diodes; Electrons; Energy resolution; Photodetectors; Pixel; Silicon; Statistics;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.870861
Filename
870861
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