• DocumentCode
    1386288
  • Title

    Photoelectron backscattering from silicon anodes of hybrid photodetector tubes

  • Author

    d´Ambrosio, C. ; Leutz, H.

  • Author_Institution
    CERN, Geneva, Switzerland
  • Volume
    47
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    1685
  • Lastpage
    1690
  • Abstract
    The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient μ, the average number of photoelectrons N¯phel emitted from the photocathode, and on the distribution of the fractional photoelectron energy q absorbed in silicon during the backscattering process. We obtained the following results: the average number of absorbed (measured) photoelectrons N¯meas in the silicon anode amounts to ~88% of the incident N¯phel. Photoelectron- and gamma-absorption peaks are broadened by a factor 1.043 due to backscattering. As an example, for photomultiplier tubes, this broadening can amount to an average factor of 1.18 due to statistic and gain fluctuations on the dynode chain
  • Keywords
    anodes; electron backscattering; elemental semiconductors; gamma-ray absorption; gamma-ray detection; photodetectors; photomultipliers; silicon; solid scintillation detectors; Si; dynode chain; fractional photoelectron energy; gamma-absorption peaks; hybrid photodetector tubes anodes; photoelectron backscattering; photomultiplier tubes; solid scintillation detectors; spectral distributions; Anodes; Backscatter; Cathodes; Diodes; Electrons; Energy resolution; Photodetectors; Pixel; Silicon; Statistics;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.870861
  • Filename
    870861