Title :
Residual Resistance Data From Cavity Production Projects at Jefferson Lab
Author :
Ciovati, Gianluigi ; Geng, Rongli ; Mammosser, John ; Saunders, Jeffrey W.
Author_Institution :
Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
A fundamental limitation towards achieving high quality factors in superconducting radio-frequency cavities is the so-called residual resistance. Understanding and controlling the residual resistance has important implications towards improving the efficiency and reduce the operating cost of continuous wave superconducting linear accelerators. In this contribution we will report on the residual resistance values obtained from measurements of the quality factor of a large set of cavities, with resonant frequency between 805 MHz and 1.5 GHz, all of them processed and tested at Jefferson Lab. Surface treatments included both buffered chemical polishing and electropolishing. The results indicate an approximate value of the residual resistance of about 7-10 nΩ.
Keywords :
Q-factor; linear accelerators; superconducting cavity resonators; surface treatment; Jefferson Lab; cavity production projects; chemical polishing; continuous wave superconducting linear accelerators; electropolishing; frequency 805 MHz to 1.5 GHz; quality factors; residual resistance data; superconducting radio-frequency cavities; surface treatments; Cavity resonators; Niobium; Radio frequency; Surface resistance; Surface treatment; Temperature measurement; Niobium; superconducting accelerator cavities; superconducting devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2087305