• DocumentCode
    1386327
  • Title

    Residual Resistance Data From Cavity Production Projects at Jefferson Lab

  • Author

    Ciovati, Gianluigi ; Geng, Rongli ; Mammosser, John ; Saunders, Jeffrey W.

  • Author_Institution
    Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1914
  • Lastpage
    1917
  • Abstract
    A fundamental limitation towards achieving high quality factors in superconducting radio-frequency cavities is the so-called residual resistance. Understanding and controlling the residual resistance has important implications towards improving the efficiency and reduce the operating cost of continuous wave superconducting linear accelerators. In this contribution we will report on the residual resistance values obtained from measurements of the quality factor of a large set of cavities, with resonant frequency between 805 MHz and 1.5 GHz, all of them processed and tested at Jefferson Lab. Surface treatments included both buffered chemical polishing and electropolishing. The results indicate an approximate value of the residual resistance of about 7-10 nΩ.
  • Keywords
    Q-factor; linear accelerators; superconducting cavity resonators; surface treatment; Jefferson Lab; cavity production projects; chemical polishing; continuous wave superconducting linear accelerators; electropolishing; frequency 805 MHz to 1.5 GHz; quality factors; residual resistance data; superconducting radio-frequency cavities; surface treatments; Cavity resonators; Niobium; Radio frequency; Surface resistance; Surface treatment; Temperature measurement; Niobium; superconducting accelerator cavities; superconducting devices;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2087305
  • Filename
    5643110