DocumentCode
1386327
Title
Residual Resistance Data From Cavity Production Projects at Jefferson Lab
Author
Ciovati, Gianluigi ; Geng, Rongli ; Mammosser, John ; Saunders, Jeffrey W.
Author_Institution
Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
1914
Lastpage
1917
Abstract
A fundamental limitation towards achieving high quality factors in superconducting radio-frequency cavities is the so-called residual resistance. Understanding and controlling the residual resistance has important implications towards improving the efficiency and reduce the operating cost of continuous wave superconducting linear accelerators. In this contribution we will report on the residual resistance values obtained from measurements of the quality factor of a large set of cavities, with resonant frequency between 805 MHz and 1.5 GHz, all of them processed and tested at Jefferson Lab. Surface treatments included both buffered chemical polishing and electropolishing. The results indicate an approximate value of the residual resistance of about 7-10 nΩ.
Keywords
Q-factor; linear accelerators; superconducting cavity resonators; surface treatment; Jefferson Lab; cavity production projects; chemical polishing; continuous wave superconducting linear accelerators; electropolishing; frequency 805 MHz to 1.5 GHz; quality factors; residual resistance data; superconducting radio-frequency cavities; surface treatments; Cavity resonators; Niobium; Radio frequency; Surface resistance; Surface treatment; Temperature measurement; Niobium; superconducting accelerator cavities; superconducting devices;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2010.2087305
Filename
5643110
Link To Document