• DocumentCode
    1386714
  • Title

    Optimized offset to eliminate first-order mode excitation at the junction of straight and curved multimode waveguides

  • Author

    Hirono, T. ; Kohtoku, M. ; Yoshikuni, Y. ; Lui, W.W. ; Yokoyama, K.

  • Author_Institution
    NTT Opto-Electron. Labs., Kanagawa, Japan
  • Volume
    10
  • Issue
    7
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    982
  • Lastpage
    984
  • Abstract
    Applications to equip semiconductor phased-array wavelength demultiplexers with nonbirefringent waveguides are increasing. In several applications, the waveguides are multimodal and elimination of first-order mode excitation is required for their design. The optimized offset for eliminating the first-order mode excitation at the junction of straight and curved waveguides with a two-dimensional (2-D) structure is analyzed theoretically. We assume that the waveguide has a laterally symmetric index profile. By the perturbation method, the offset is obtained to the first order in the inverse of the bending radius. The offset is simply expressed by the effective refractive indices of the straight waveguide.
  • Keywords
    arrays; bending; demultiplexing equipment; optical design techniques; optical waveguide theory; optimisation; perturbation theory; refractive index; symmetry; wavelength division multiplexing; 2D structure; bending radius; curved multimode waveguides; effective refractive indices; first-order mode excitation; laterally symmetric index profile; nonbirefringent waveguides; optical waveguide boundaries; optical waveguide theory; optimized offset; perturbation method; semiconductor phased-array wavelength demultiplexers; straight multimode waveguides; Optical crosstalk; Optical refraction; Optical waveguide theory; Optical waveguides; Perturbation methods; Planar waveguides; Semiconductor waveguides; Waveguide junctions; Waveguide theory; Waveguide transitions;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.681291
  • Filename
    681291