Title :
Performance Assessment of MIMO-BICM Demodulators Based on Mutual Information
Author :
Fertl, Peter ; Jaldén, Joakim ; Matz, Gerald
Author_Institution :
BMW Group Res. & Technol., Munich, Germany
fDate :
3/1/2012 12:00:00 AM
Abstract :
We provide a comprehensive performance comparison of soft-output and hard-output demodulators in the context of non-iterative multiple-input multiple-output bit-interleaved coded modulation (MIMO-BICM). Coded bit error rate (BER), widely used in literature for demodulator comparison, has the drawback of depending strongly on the error correcting code being used. This motivates us to propose the mutual information of the equivalent modulation channel (comprising modulator, wireless channel, and demodulator) as a code-independent performance measure. We present extensive numerical results for spatially independent identically distributed (i.i.d.) ergodic and quasi-static fading channels under perfect and imperfect channel state information. These results reveal that the performance ranking of MIMO demodulators is rate-dependent and provide new insights regarding MIMO-BICM system design, i.e., the choice of antenna configuration, symbol constellation, and demodulator for a given target rate.
Keywords :
MIMO communication; demodulators; error correction codes; error statistics; fading channels; interleaved codes; BER; MIMO-BICM demodulators; antenna configuration; channel state information; code-independent performance measure; coded bit error rate; ergodic channels; error correcting code; hard-output demodulators; modulation channel; mutual information; noniterative multiple-input multiple-output bit-interleaved coded modulation; quasi-static fading channels; soft-output demodulators; symbol constellation; Complexity theory; Decoding; Demodulation; MIMO; Mutual information; Vectors; Bit-interleaved coded modulation (BICM); log-likelihood ratio; multiple-input–multiple-output (MIMO); mutual information; performance limits; soft demodulation;
Journal_Title :
Signal Processing, IEEE Transactions on
DOI :
10.1109/TSP.2011.2177823